Image simulation for electron energy loss spectroscopy

Micron

Volumn 39, Issue 6, 2008, Pages 676-684

  Oxley, M P ^a   Pennycook, S J ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

EELS; Localization; Nonlocality; STEM

Indexed keywords

DETECTORS; DISSOCIATION; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ELECTRON SPECTROSCOPY; ELECTRONS; ENERGY DISSIPATION; NUCLEAR INSTRUMENTATION; OPTICS; SPECTROMETERS; SPECTROMETRY; TRANSMISSION ELECTRON MICROSCOPY;

ABERRATION CORRECTIONS; DETECTOR SIZE; ELECTRON ENERGY LOSSES; ELECTRON ENERGY-LOSS SPECTROMETRY; ELECTRON PROBING; IMAGE SIMULATIONS; NON LOCAL; SCANNING TRANSMISSION ELECTRON MICROSCOPE (STEM);

ELECTRON ENERGY LOSS SPECTROSCOPY;

ARTICLE; ELECTRON ENERGY LOSS SPECTROSCOPY; IMAGE PROCESSING; INSTRUMENTATION; METHODOLOGY;

IMAGE PROCESSING, COMPUTER-ASSISTED; SPECTROSCOPY, ELECTRON ENERGY-LOSS;

EID: 48049106693     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2007.10.020     Document Type: Article

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