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Volumn 22, Issue 14, 2011, Pages

Si-Sb-Te materials for phase change memory applications

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING TEMPERATURES; AUTOMOTIVE ELECTRONICS; DATA RETENTION; DATA STORAGE; ELECTRICAL PERFORMANCE; LONG-TERM OPERATION; PCRAM CELLS; PHASE CHANGE RANDOM ACCESS MEMORY; SI CONTENT; THERMAL STABILITY;

EID: 79952653397     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/14/145702     Document Type: Article
Times cited : (100)

References (42)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.