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Volumn 2, Issue 9, 2009, Pages
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Si2Sb2Te6 phase change material for low-power phase change memory application
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Author keywords
[No Author keywords available]
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Indexed keywords
ALLOY TARGET;
CHALCOGENIDE RANDOM ACCESS MEMORY;
LOW POWER;
PHASE CHANGE RANDOM ACCESS MEMORY DEVICES;
RESET VOLTAGE;
RESISTANCE RATIO;
THRESHOLD CURRENTS;
VOLTAGE PULSE;
BUOYANCY;
DIFFRACTION;
HOLOGRAPHIC INTERFEROMETRY;
RANDOM ACCESS STORAGE;
SILICON;
SILICON ALLOYS;
TELLURIUM COMPOUNDS;
PHASE CHANGE MEMORY;
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EID: 70349154133
PISSN: 18820778
EISSN: 18820786
Source Type: Journal
DOI: 10.1143/APEX.2.091401 Document Type: Article |
Times cited : (21)
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References (13)
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