Structural transformations of [formula omitted] films studied by electrical resistance measurements

Journal of Applied Physics

Volumn 87, Issue 9, 2000, Pages 4130-4134

  Friedrich, I ^a,b,c   Weidenhof, V ^a,b,c   Njoroge, W ^b   Franz, P ^b   Wuttig, M ^b  

^a Institut für Grenzflächenforschung und Vakuumphysik Forschungzentrum Jülich   (United States)

^b RWTH AACHEN UNIVERSITY   (Germany)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000629043     PISSN: 00218979     EISSN: 10897550     Source Type: Journal    
DOI: 10.1063/1.373041     Document Type: Article

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