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Volumn 90, Issue 14, 2007, Pages

Evidence for segregation of Te in Ge2 Sb2 Te5 films: Effect on the "phase-change" stress

Author keywords

[No Author keywords available]

Indexed keywords

CHALCOGENIDES; FILM GROWTH; GRAIN BOUNDARIES; GRAIN GROWTH; PHASE TRANSITIONS; SEGREGATION (METALLOGRAPHY); TRANSMISSION ELECTRON MICROSCOPY;

EID: 34147138226     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2719148     Document Type: Article
Times cited : (115)

References (18)
  • 1
    • 36049053305 scopus 로고
    • 0031-9007 10.1103/PhysRevLett.21.1450
    • S. R. Ovchinsky, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.21.1450 21, 1450 (1968); S. R. Ovchinsky, J. Non-Cryst. Solids 2, 99 (1970).
    • (1968) Phys. Rev. Lett. , vol.21 , pp. 1450
    • Ovchinsky, S.R.1
  • 2
    • 0042367852 scopus 로고
    • S. R. Ovchinsky, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.21.1450 21, 1450 (1968); S. R. Ovchinsky, J. Non-Cryst. Solids 2, 99 (1970).
    • (1970) J. Non-Cryst. Solids , vol.2 , pp. 99
    • Ovchinsky, S.R.1
  • 6
    • 0036227050 scopus 로고    scopus 로고
    • Proceedings of the IEEE International Solid State Circuits Conference, New York
    • M. Gill, T. Lowrey, and J. Park, Proceedings of the IEEE International Solid State Circuits Conference, New York, 2002, Vol. 2, p. 158.
    • (2002) , vol.2 , pp. 158
    • Gill, M.1    Lowrey, T.2    Park, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.