In situ elastic strain measurements-diffraction and spectroscopy

MRS Bulletin

Volumn 35, Issue 5, 2010, Pages 368-374

  Spolenak, R ^a   Ludwig, W ^a   Buffiere, J Y ^a   Michler, J ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; DATA ACQUISITION; DEFORMATION;

AVERAGING TECHNIQUE; DIFFRACTION TECHNIQUES; ELASTIC STRAIN MEASUREMENT; IN-SITU MEASUREMENT; MECHANICAL PROPERTIES OF MATERIALS; MECHANICAL STRESS; RAPID DATA ACQUISITION; STRESS DETERMINATION;

DIFFRACTION;

EID: 77952708329     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/mrs2010.569     Document Type: Article

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