Mapping two-dimensional state of strain using synchroton X-ray diffraction

Scripta Materialia

Volumn 39, Issue 12, 1998, Pages 1705-1712

  Korsunsky, Alexander M ^a   Wells, Karen E ^a   Withers, Philip J ^b  

^a NEWCASTLE UNIVERSITY   (United Kingdom)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CURVE FITTING; ELASTOPLASTICITY; MATHEMATICAL MODELS; MATHEMATICAL TECHNIQUES; NEUTRON DIFFRACTION; POLYCRYSTALLINE MATERIALS; REINFORCEMENT; RESIDUAL STRESSES; SILICON CARBIDE; STATISTICAL METHODS; STRAIN MEASUREMENT; TENSILE STRESS;

DIGITAL PATTERN COLLECTION; MICROMECHANICAL MODELLING; STRAIN MAPPING;

X RAY DIFFRACTION ANALYSIS;

EID: 0032207410     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(98)00385-6     Document Type: Article

References (7)

1. A. M. Korsunsky, P. J. Withers, and P. J. Webster, ESRF Experiment Report HS300 (1997).
2. M. E. Fitzpatrick, P. J. Withers, and M. T. Hutchings, Acta Mater. 45, 4867 (1997).
3. A. M. Korsunsky and P. J. Withers, Int. J. Solids Struct. 34, 1985 (1997).
4. M. R. Watts, M. E. Fitzpatrick, A. M. Korsunsky, and P. J. Withers, in Proceedings of the 4th European Conference on Residual Stresses (ECRS 4), Cluny, France (1996).
5. I. C. Noyan and J. B. Cohen, Mater. Sci. Eng. 75, 179 (1985).
6. O. B. Pedersen, Acta Metall. 31, 1795 (1983).
7. M. R. Daymond and P. J. Withers. Scripta Mater. 35, 1229 (1996).