Local plasticity of Al thin films as revealed by X-ray microdiffraction

Physical Review Letters

Volumn 90, Issue 9, 2003, Pages

  Spolenak, R ^a   Brown, W L ^a   Tamura, N ^b   MacDowell, A A ^b   Celestre, R S ^b   Padmore, H A ^b   Valek, B ^c   Bravman, J C ^c   Marieb, T ^d   Fujimoto, H ^d   Batterman, B W ^b,e   Patel, J R ^b,e  

^a NOKIA RESEARCH CENTER   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c Stanford University   (United States)

^d INTEL CORPORATION   (United States)

^e SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; DISLOCATIONS (CRYSTALS); GRAIN SIZE AND SHAPE; PLASTICITY; SINGLE CRYSTALS; STRAIN; THICKNESS MEASUREMENT; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

GRAIN INTERACTIONS; STRAIN DISTRIBUTIONS; X RAY MICRODIFFRACTION;

ALUMINUM;

EID: 0037424172     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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