메뉴 건너뛰기




Volumn 83, Issue 1, 1998, Pages 187-197

Complementary application of electron microscopy and micro-Raman spectroscopy for microstructure, stress, and bonding defect investigation of heteroepitaxial chemical vapor deposited diamond films

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CRYSTAL DEFECTS; CRYSTAL MICROSTRUCTURE; DIAMOND FILMS; GRAIN SIZE AND SHAPE; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICON WAFERS; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0031699377     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366672     Document Type: Article
Times cited : (104)

References (38)
  • 34
    • 0001021287 scopus 로고
    • edited by F. Nabarro North Holland, Amsterdam
    • A. E. Romanov and V. I. Vladimirov, in Dislocations in Solids, edited by F. Nabarro (North Holland, Amsterdam, 1992), Vol. 9, p. 191.
    • (1992) Dislocations in Solids , vol.9 , pp. 191
    • Romanov, A.E.1    Vladimirov, V.I.2
  • 36
    • 11744349641 scopus 로고    scopus 로고
    • Dissertation, Technische Universität Wien, Austria
    • M. Joksch, Dissertation, Technische Universität Wien, Austria, 1996.
    • (1996)
    • Joksch, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.