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Journal of Applied Physics

Volumn 104, Issue 2, 2008, Pages

Coherency effects in nanobeam x-ray diffraction analysis

(4) Yan, Hanfei a,b Kalenci, Özgür b,c Noyan, I Cevdet c Maser, Jörg b

a BROOKHAVEN NATIONAL LABORATORY (United States)

b ARGONNE NATIONAL LABORATORY (United States)

c Columbia University ^* (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BEAMS AND GIRDERS; DIFFRACTION; NANOSTRUCTURES; NANOWIRES; SCATTERING; SINGLE CRYSTALS;

FRESNEL NUMBERS; NANO BEAMS; PINHOLE DIFFRACTION; REAL-SPACE; RECIPROCAL SPACES; X -RAY SCATTERING; X-RAY DIFFRACTION;

X RAY DIFFRACTION ANALYSIS;

EID: 48849090898 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.2955714 Document Type: Article

Times cited : (5)

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