In situ X-ray diffraction during forced silking of spider silk

Macromolecules

Volumn 32, Issue 13, 1999, Pages 4464-4466

  Riekel, Christian ^a   Müller, Martin ^a   Vollrath, Fritz ^b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b AARHUS UNIVERSITY   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTAL STRUCTURE; MECHANICAL PROPERTIES; MOLECULES; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

SILKING; SPIDER SILK;

POLYMERS;

EID: 0345148337     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma990067a     Document Type: Article

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