The relationship between thin film fragmentation and buckle formation: Synchrotron-based in situ studies and two-dimensional stress analysis

Acta Materialia

Volumn 57, Issue 5, 2009, Pages 1442-1453

  Frank, Stephan ^a   Handge, Ulrich A ^b   Olliges, Sven ^a   Spolenak, Ralph ^a  

^a ETH ZURICH   (Switzerland)

^b UNIVERSITY OF BAYREUTH   (Germany)

Author keywords

Buckling; Fracture; Synchrotron radiation; Tantalum; Thin films

Indexed keywords

BUCKLING; COMPRESSIVE STRESS; CRACKS; ELECTROMAGNETIC WAVES; FRACTURE; FRACTURE TOUGHNESS; POISSON RATIO; POLYIMIDES; POLYMERS; RESIDUAL STRESSES; SOLIDS; STRENGTH OF MATERIALS; SUBSTRATES; SYNCHROTRON RADIATION; SYNCHROTRONS; TANTALUM; TENSILE STRESS; TENSILE TESTING; THIN FILMS; TRANSITION METALS;

ANALYTICAL SOLUTIONS; APPLIED STRAINS; BIAXIAL STRESS; BUCKLE FORMATIONS; IN-SITU; IN-SITU STUDIES; LIGHT MICROSCOPIES; POLYIMIDE SUBSTRATES; RATIO MISMATCHES; SHEAR-LAG MODELS; SYNCHROTRON-BASED TECHNIQUES; TWO-DIMENSIONAL STRESS; UNIAXIAL TENSILE TESTING;

TENSILE STRENGTH;

EID: 60249099638     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2008.11.023     Document Type: Article

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