Tip-Enhanced Raman spectroscopy for nanoscale strain characterization

Analytical and Bioanalytical Chemistry

Volumn 394, Issue 7, 2009, Pages 1775-1785

  Tarun, Alvarado ^a   Hayazawa, Norihiko ^a,c   Kawata, Satoshi ^a,b,c  

^a RIKEN   (Japan)

^b Department of Precision Science ^*  (Japan)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

IR spectroscopy; Laser spectroscopy; Nanoparticles nanotechnology; Raman spectroscopy; Spectroscopy instrumentation; UV VIS

Indexed keywords

IR SPECTROSCOPY; MATERIAL IDENTIFICATION; METALLIC TIPS; NANO SCALE; NANOPARTICLES/ NANOTECHNOLOGY; NANOSCALE CHARACTERIZATION; OPTICAL FIELD; QUANTUM DOT; SILICON DEVICES; SPECTROSCOPIC IMAGES; SPECTROSCOPY/INSTRUMENTATION; STRAIN CHARACTERIZATION; STRAIN DISTRIBUTIONS; STRAINED SILICON DEVICES; TIP-ENHANCED RAMAN SPECTROSCOPY; UV/VIS;

LASER SPECTROSCOPY; NANOSTRUCTURED MATERIALS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR LASERS; SEMICONDUCTOR QUANTUM DOTS; VIBRATIONAL SPECTRA;

STRAIN;

NANOMATERIAL; QUANTUM DOT; SILICON;

CHEMISTRY; INSTRUMENTATION; METHODOLOGY; RAMAN SPECTROMETRY; REVIEW; SEMICONDUCTOR; SURFACE PROPERTY;

NANOSTRUCTURES; QUANTUM DOTS; SEMICONDUCTORS; SILICON; SPECTRUM ANALYSIS, RAMAN; SURFACE PROPERTIES;

EID: 68349096307     PISSN: 16182642     EISSN: 16182650     Source Type: Journal    
DOI: 10.1007/s00216-009-2771-3     Document Type: Review

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