Detection and characterization of longitudinal field for tip-enhanced Raman spectroscopy

Applied Physics Letters

Volumn 85, Issue 25, 2004, Pages 6239-6241

  Hayazawa, Norihiko ^a,b   Saito, Yuika ^a   Kawata, Satoshi ^a,b,c  

^a RIKEN   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; ELECTRIC EXCITATION; ELECTRIC FIELD EFFECTS; FLUORESCENCE; NANOSTRUCTURED MATERIALS; POLARIZATION; SENSITIVITY ANALYSIS; SINGLE CRYSTALS; SPECTRUM ANALYSIS;

LIQUID NITROGEN; NANOCRYSTALS; NEAR-FIELD MICROSCOPY; TIP-ENHANCED RAMAN SPECTROSCOPY;

RAMAN SPECTROSCOPY;

EID: 14744304626     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1839646     Document Type: Article

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