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Volumn 6, Issue 1, 2008, Pages 76-87

A microelectromechanical system for nano-scale testing of one dimensional nanostructures

Author keywords

Carbon nanotube; Material testing; Nanowire

Indexed keywords

AIRCRAFT MODELS; COMPOSITE MICROMECHANICS; ELECTRIC WIRE; ELECTROMECHANICAL DEVICES; ELECTROSTATIC ACTUATORS; INSTRUMENTS; MEMS; MICROELECTROMECHANICAL DEVICES; NANOCOMPOSITES; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; NANOTUBES; NANOWIRES; TENSILE TESTING;

EID: 58049193939     PISSN: 1546198X     EISSN: None     Source Type: Journal    
DOI: 10.1166/sl.2008.015     Document Type: Conference Paper
Times cited : (10)

References (56)
  • 34
  • 35
    • 0942281276 scopus 로고    scopus 로고
    • Electronics for micromachined inertial sensors
    • Chicago, IL
    • P. E. Boser, Electronics for micromachined inertial sensors, Proc. Transducers, Chicago, IL (1997).
    • (1997) Proc. Transducers
    • Boser, P.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.