Contact potential measurement of carbon nanotube by Kelvin probe force microscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 42, Issue 4 B, 2003, Pages 2449-2452

  Maeda, Chikashi ^a   Kishimoto, Shigeru ^a   Mizutani, Takasi ^a   Sugai, Toshiki ^a   Shinohara, Hisanori ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

Carbon nanotube; CNT tip; Contact potential difference; KFM; Work function

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONTACTS; ELECTRIC RESISTANCE; ELECTRODES; SILICON ON INSULATOR TECHNOLOGY; THERMAL EFFECTS; VOLTAGE MEASUREMENT;

BIAS VOLTAGE; CONTACT POTENTIAL MEASUREMENT; KELVIN PROBE FORCE MICROSCOPY; POTENTIAL DROP;

CARBON NANOTUBES;

EID: 0038685403     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.2449     Document Type: Article

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