SCOPUS 정보 검색 플랫폼

Advanced Functional Materials

Volumn 16, Issue 7, 2006, Pages 879-884

Structural and electrostatic complexity at a pentacenc/insulator interface

(4) Puntambekar, Kanan a Dong, Jinping b Haugstad, Greg b Frisbie, C Daniel a

a University of Minnesota (United States)

b UNIVERSITY OF MINNESOTA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; ELECTROSTATICS; GRAIN BOUNDARIES; OPTICAL MICROSCOPY; SEMICONDUCTOR INSULATOR BOUNDARIES; SILICA; THIN FILM TRANSISTORS; TRANSPORT PROPERTIES;

KELVIN PROBE FORCE MICROSCOPY; LATERAL FORCE MICROSCOPY; ORGANIC THIN-FILM TRANSISTORS (OTFTS); ORGANIC-SEMICONDUCTOR/INSULATOR;

SEMICONDUCTING ORGANIC COMPOUNDS;

EID: 33646585462 PISSN: 1616301X EISSN: 16163028 Source Type: Journal
DOI: 10.1002/adfm.200500816 Document Type: Article

Times cited : (139)

References (40)

1
- 0141938911
- W. Y. Gao, A. Kahn, J. Phys. Condens. Matter 2003,15, S2757.
- (2003) J. Phys. Condens. Matter , vol.15
- Gao, W.Y.¹ Kahn, A.²

2
- 0011336568
- H. Ishii, K. Sugiyama, E. Ito, K. Seki. Adv. Mater. 1999, 11, 605.
- (1999) Adv. Mater. , vol.11 , pp. 605
- Ishii, H.¹ Sugiyama, K.² Ito, E.³ Seki, K.⁴

3
- 8444231667
- J. Veres, S. Ogier, G. Lloyd, D. de Leeuw, Chem. Mater. 2004, 16, 4543.
- (2004) Chem. Mater. , vol.16 , pp. 4543
- Veres, J.¹ Ogier, S.² Lloyd, G.³ De Leeuw, D.⁴

4
- 0242605620
- Marcel Dekker, New York
- J. A. Rogers, Z. Bao, H. E. Katz, A. Dodabalapur, Thin-Film Transistors, Marcel Dekker, New York 2003, p. 377.
- (2003) Thin-film Transistors , pp. 377
- Rogers, J.A.¹ Bao, Z.² Katz, H.E.³ Dodabalapur, A.⁴

5
- 0037116556
- C. D. Dimitrakopoulos, P. R. L. Malenfant, Adv. Mater. 2002,14, 99.
- (2002) Adv. Mater. , vol.14 , pp. 99
- Dimitrakopoulos, C.D.¹ Malenfant, P.R.L.²

6
- 0034672078
- H. Sirringhaus, T. Kawase, R. H. Friend, T. Shimoda, M. Inbasekaran. W. Wu, E. P. Woo, Science 2000,290, 2123.
- (2000) Science , vol.290 , pp. 2123
- Sirringhaus, H.¹ Kawase, T.² Friend, R.H.³ Shimoda, T.⁴ Inbasekaran, M.⁵ Wu, W.⁶ Woo, E.P.⁷

7
- 79956024105
- L. Burgi, H. Sirringhaus, R. H. Friend, Appl. Phys. Lett. 2002, 80, 2913.
- (2002) Appl. Phys. Lett. , vol.80 , pp. 2913
- Burgi, L.¹ Sirringhaus, H.² Friend, R.H.³

8
- 0343081409
- H. Klauk, T. N. Jackson, Solid State Technol. 2000, 43, 63.
- (2000) Solid State Technol. , vol.43 , pp. 63
- Klauk, H.¹ Jackson, T.N.²

9
- 11044237704
- P. V. Pesavento, R. J. Chesterfield, C. R. Newman. C. D. Frisbie, J. Appl. Phys. 2004, 96, 7312.
- (2004) J. Appl. Phys. , vol.96 , pp. 7312
- Pesavento, P.V.¹ Chesterfield, R.J.² Newman, C.R.³ Frisbie, C.D.⁴

10
- 0038646266
- D. Knipp, R. A. Street, A. R. Volkel. Appl. Phys. Lett. 2003, 82, 3907.
- (2003) Appl. Phys. Lett. , vol.82 , pp. 3907
- Knipp, D.¹ Street, R.A.² Volkel, A.R.³

11
- 8544260372
- R. Ruiz, D. Choudhary, B. Nickel, T. Toccoli, K. C. Chang, A. C. Mayer, P. Clancy, J. M. Blakely, R. L. Headrick. S. Iannotta. G. G. Malliaras, Chem. Maler. 2004,16, 4497.
- (2004) Chem. Maler. , vol.16 , pp. 4497
- Ruiz, R.¹ Choudhary, D.² Nickel, B.³ Toccoli, T.⁴ Chang, K.C.⁵ Mayer, A.C.⁶ Clancy, P.⁷ Blakely, J.M.⁸ Headrick, R.L.⁹ Iannotta, S.¹⁰ Malliaras, G.G.¹¹

12
- 1842607461
- S. E. Fritz, S. M. Martin, C. D. Frisbie, M. D. Ward, M. F. Toney, J. Am. Chem. Soc. 2004, 126, 4084.
- (2004) J. Am. Chem. Soc. , vol.126 , pp. 4084
- Fritz, S.E.¹ Martin, S.M.² Frisbie, C.D.³ Ward, M.D.⁴ Toney, M.F.⁵

13
- 0037705389
- C. C. Mauheus, A. B. Dros, J. Baas, G. T. Oostergetel, A. Meetsma, J. L. de Boer, T. T. M. Palstra, Synth. Met. 2003, 138, 475.
- (2003) Synth. Met. , vol.138 , pp. 475
- Mauheus, C.C.¹ Dros, A.B.² Baas, J.³ Oostergetel, G.T.⁴ Meetsma, A.⁵ De Boer, J.L.⁶ Palstra, T.T.M.⁷

14
- 0035797427
- F. J. Meyer zu Heringdorf, M. C. Reuter, R. M. Tromp, Nature 2001, 412, 517.
- (2001) Nature , vol.412 , pp. 517
- Zu Heringdorf, F.J.M.¹ Reuter, M.C.² Tromp, R.M.³

15
- 8544274399
- B. Nickel, R. Barabash. R. Ruiz, N. Koch, A. Kahn, L. C. Feldman. R. F. Haglund, G. Scoles, Phys. Rev. B 2004, 70. 125401.
- (2004) Phys. Rev. B , vol.70 , pp. 125401
- Nickel, B.¹ Barabash, R.² Ruiz, R.³ Koch, N.⁴ Kahn, A.⁵ Feldman, L.C.⁶ Haglund, R.F.⁷ Scoles, G.⁸

16
- 23944443280
- H. C. Yang, T. J. Shin, M. M. Ling, K. Cho, C. Y. Ryu, Z. N. Bao, J. Am. Chem. Soc. 2005.127, 11 542.
- (2005) J. Am. Chem. Soc. , vol.127
- Yang, H.C.¹ Shin, T.J.² Ling, M.M.³ Cho, K.⁴ Ryu, C.Y.⁵ Bao, Z.N.⁶

17
- 0030244803
- J. A. Last, M. D. Ward. Adv. Maler. 1996, 8, 730.
- (1996) Adv. Maler. , vol.8 , pp. 730
- Last, J.A.¹ Ward, M.D.²

18
- 0043039452
- R. W. Carpick, M. Salmeron, Chem. Rev. 1997, 97, 1163.
- (1997) Chem. Rev. , vol.97 , pp. 1163
- Carpick, R.W.¹ Salmeron, M.²

19
- 33745604763
- M. Nonnenmacher. M. P. O'Boyle, H. K. Wickramasinghe, Appl. Phys. Lett. 1991, 58, 2921.
- (1991) Appl. Phys. Lett. , vol.58 , pp. 2921
- Nonnenmacher, M.¹ O'Boyle, M.P.² Wickramasinghe, H.K.³

20
- 6744222833
- M. Fujihira, Annu. Rev. Maler. Sci. 1999, 29, 353.
- (1999) Annu. Rev. Maler. Sci. , vol.29 , pp. 353
- Fujihira, M.¹

21
- 0001648770
- H. O. Jacobs, P. Leuchtmann, O. J. Homan. A. Stemmer. J. Appl. Phys. 1998, 84, 1168.
- (1998) J. Appl. Phys. , vol.84 , pp. 1168
- Jacobs, H.O.¹ Leuchtmann, P.² Homan, O.J.³ Stemmer, A.⁴

22
- 0042338736
- J. E. Northrup. M. L. Chabinyc, Phys. Rev. B 2003, 68, 041 202(R).
- (2003) Phys. Rev. B , vol.68
- Northrup, J.E.¹ Chabinyc, M.L.²

23
- 0037016608
- L. F. Drummy, C. Kubel. D. Lee, A. White, D. C. Martin, Adv. Mater.2002, 14, 54.
- (2002) Adv. Mater. , vol.14 , pp. 54
- Drummy, L.F.¹ Kubel, C.² Lee, D.³ White, A.⁴ Martin, D.C.⁵

24
- 20444504759
- E. M. Muller. J. A. Marohn, Adv. Mater. 2005, 17, 1410.
- (2005) Adv. Mater. , vol.17 , pp. 1410
- Muller, E.M.¹ Marohn, J.A.²

25
- 0034227151
- G. Horowitz, M. E. Hajlaoui. Adv. Mater. 2000, 12, 1046.
- (2000) Adv. Mater. , vol.12 , pp. 1046
- Horowitz, G.¹ Hajlaoui, M.E.²

26
- 13544273923
- L. W. Chen. R. Ludeke. X. D. Cui. A. G. Schrott, C. R. Kagan. L. E. Brus,J. Phys. Chem. B 2005, 109, 1834.
- (2005) J. Phys. Chem. B , vol.109 , pp. 1834
- Chen, L.W.¹ Ludeke, R.² Cui, X.D.³ Schrott, A.G.⁴ Kagan, C.R.⁵ Brus, L.E.⁶

27
- 28844497477
- N. T. Corke, A. A. Kawada. J. N. Sherwood, Nature 1967, 213, 62.
- (1967) Nature , vol.213 , pp. 62
- Corke, N.T.¹ Kawada, A.A.² Sherwood, J.N.³

28
- 0003630507
- McGraw Hill. New York
- G. Dieter. Mechanical Metallurgy, McGraw Hill. New York 1986.
- (1986) Mechanical Metallurgy
- Dieter, G.¹

29
- 0141959787
- M. Brinkmann, S. Graff, C. Straupe, J.-C. Wittmann, C. Chaumont, F. Nuesch. A. Aziz. M. Schaer, L. J. Zuppiroli. J. Phys. Chem. B 2003.107. 10531.
- (2003) J. Phys. Chem. B , vol.107 , pp. 10531
- Brinkmann, M.¹ Graff, S.² Straupe, C.³ Wittmann, J.-C.⁴ Chaumont, C.⁵ Nuesch, F.⁶ Aziz, A.⁷ Schaer, M.⁸ Zuppiroli, L.J.⁹

30
- 0035906198
- D. Fichou, F. Charra, A. O. Gusev, Adv. Mater. 2001, 13, 555.
- (2001) Adv. Mater. , vol.13 , pp. 555
- Fichou, D.¹ Charra, F.² Gusev, A.O.³

31
- 0042512254
- B. S. Simpkins, E. T. Yu, P. Waltereit, J. S. Speck, J. Appl. Phys. 2003, 94, 1448.
- (2003) J. Appl. Phys. , vol.94 , pp. 1448
- Simpkins, B.S.¹ Yu, E.T.² Waltereit, P.³ Speck, J.S.⁴

32
- 0009546612
- R. W. Carpick. Q. Dai. D. F. Ogletrec, M. Salmeron, Tribal. Lett.1998, 5, 91.
- (1998) Tribal. Lett. , vol.5 , pp. 91
- Carpick, R.W.¹ Dai, Q.² Ogletrec, D.F.³ Salmeron, M.⁴

33
- 0035857418
- J. Corail, J. P. Calbert. J. L. Brédas.J Am. Chem. Soc. 2001, 123, 1250.
- (2001) J Am. Chem. Soc. , vol.123 , pp. 1250
- Corail, J.¹ Calbert, J.P.² Brédas, J.L.³

34
- 0038034828
- J. E. Northrup, M. L. Tiago, S. G. Louie, Phys. Rev. B 2002, 66, 121404.
- (2002) Phys. Rev. B , vol.66 , pp. 121404
- Northrup, J.E.¹ Tiago, M.L.² Louie, S.G.³

35
- 20844439693
- J. H. Kang, D. da Silva, J. L. Brédas, X. Y. Zhu, Appl. Phys. Lett. 2005, 86, 152115.
- (2005) Appl. Phys. Lett. , vol.86 , pp. 152115
- Kang, J.H.¹ Da Silva, D.² Brédas, J.L.³ Zhu, X.Y.⁴

36
- 33646551100
- S. Hayashi, I. Okada, N. Ide, K. Kojima, J. Phys. Condens. Matter 1992, 4, L379.
- (1992) J. Phys. Condens. Matter , vol.4
- Hayashi, S.¹ Okada, I.² Ide, N.³ Kojima, K.⁴

37
- 0342618427
- H. O. Jacobs, H. F. Knapp, S. Mueller, A. Stemmer, Ultramicroscopy 1997, 69, 39.
- (1997) Ultramicroscopy , vol.69 , pp. 39
- Jacobs, H.O.¹ Knapp, H.F.² Mueller, S.³ Stemmer, A.⁴

38
- 0000045426
- H. O. Jacobs, H. F. Knapp, S. Mueller, A. Stemmer, Rev. Sci. Instrum. 1999, 70, 1756.
- (1999) Rev. Sci. Instrum. , vol.70 , pp. 1756
- Jacobs, H.O.¹ Knapp, H.F.² Mueller, S.³ Stemmer, A.⁴

39
- 0013196006
- (Eds: J. Frommer, R. M. Overney).ACS Books, Washington, DC
- G. Haugstad, J. A. Hammerschmidt, W. L. Gladfelter, in Interfacial Properties on the Submicron Scale (Eds: J. Frommer, R. M. Overney).ACS Books, Washington, DC 2001, p. 230.
- (2001) Interfacial Properties on the Submicron Scale , pp. 230
- Haugstad, G.¹ Hammerschmidt, J.A.² Gladfelter, W.L.³

40
- 0000191570
- X. D. Xiao, J. Hu, D. H. Charych, M. Salmeron, Langmuir 1996, 12, 235.
- (1996) Langmuir , vol.12 , pp. 235
- Xiao, X.D.¹ Hu, J.² Charych, D.H.³ Salmeron, M.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.