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Advanced Functional Materials

Volumn 16, Issue 7, 2006, Pages 879-884

Structural and electrostatic complexity at a pentacenc/insulator interface

(4) Puntambekar, Kanan a Dong, Jinping b Haugstad, Greg b Frisbie, C Daniel a

a University of Minnesota ^* (United States)

b UNIVERSITY OF MINNESOTA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; ELECTROSTATICS; GRAIN BOUNDARIES; OPTICAL MICROSCOPY; SEMICONDUCTOR INSULATOR BOUNDARIES; SILICA; THIN FILM TRANSISTORS; TRANSPORT PROPERTIES;

KELVIN PROBE FORCE MICROSCOPY; LATERAL FORCE MICROSCOPY; ORGANIC THIN-FILM TRANSISTORS (OTFTS); ORGANIC-SEMICONDUCTOR/INSULATOR;

SEMICONDUCTING ORGANIC COMPOUNDS;

EID: 33646585462 PISSN: 1616301X EISSN: 16163028 Source Type: Journal
DOI: 10.1002/adfm.200500816 Document Type: Article

Times cited : (138)

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