A high-resolution scanning Kelvin probe microscope for contact potential measurements on the 100 nm scale

Review of Scientific Instruments

Volumn 68, Issue 8, 1997, Pages 3108-3111

  Nabhan, W ^a   Equer, B ^a   Broniatowski, A ^b   De Rosny, G ^b  

^a LABORATOIRE DE PHYSIQUE DES INTERFACES ET DES COUCHES MINCES   (France)

^b UNIVERSITÉ PARIS DESCARTES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001120632     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148251     Document Type: Article

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