Kelvin probe force microscopy imaging using carbon nanotube probe

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 6 B, 2001, Pages 4314-4316

  Takahashi, S ^a   Kishida, T ^a   Akita, S ^a   Nakayama, Y ^a  

^a Osaka Prefecture University   (Japan)

Author keywords

Carbon nanotube; KFM; Nanotube probe; Work function

Indexed keywords

ALUMINUM; DISPERSIONS; SEMICONDUCTOR DEVICES; SUBSTRATES; SURFACE PHENOMENA;

CONTACT POTENTIAL DIFFRENCE (CPD); KELVIN PROBE FORCE MICROSCOPY IMAGING;

CARBON NANOTUBES;

EID: 0035357439     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.40.4314     Document Type: Article

References (5)