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Volumn 17, Issue 21, 2006, Pages 5491-5500

Quantitative analysis of tip-sample interaction in non-contact scanning force spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

DATA PROCESSING; ELECTROSTATICS; IMAGE RETRIEVAL; NATURAL FREQUENCIES; OPTIMIZATION; VAN DER WAALS FORCES;

EID: 33846111667     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/17/21/033     Document Type: Article
Times cited : (19)

References (49)
  • 22
    • 36449005197 scopus 로고
    • Interaction force detection in scanning probe microscopy: Methods and applications
    • Dürig U, Züger O and Stalder A 1992 Interaction force detection in scanning probe microscopy: methods and applications J. Appl. Phys. 72 1778-98
    • (1992) J. Appl. Phys. , vol.72 , Issue.5 , pp. 1778-1798
    • Dürig, U.1    Züger, O.2    Stalder, A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.