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Volumn 17, Issue 21, 2006, Pages 5491-5500
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Quantitative analysis of tip-sample interaction in non-contact scanning force spectroscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
DATA PROCESSING;
ELECTROSTATICS;
IMAGE RETRIEVAL;
NATURAL FREQUENCIES;
OPTIMIZATION;
VAN DER WAALS FORCES;
BIAS VOLTAGE;
IMAGE ACQUISITION;
SCANNING FORCE SPECTROSCOPY;
TIP SAMPLE INTERACTION;
SPECTROSCOPIC ANALYSIS;
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EID: 33846111667
PISSN: 09574484
EISSN: 13616528
Source Type: Journal
DOI: 10.1088/0957-4484/17/21/033 Document Type: Article |
Times cited : (19)
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References (49)
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