Elemental redistribution and Ge loss during ion-beam synthesis of Ge nanocrystals in SiO2 films

Physical Review B - Condensed Matter and Materials Physics

Volumn 77, Issue 1, 2008, Pages

  Beyer, V ^a   Von Borany, J ^a  

^a INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 38549108397     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.77.014107     Document Type: Article

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