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Volumn 74, Issue 16, 1999, Pages 2331-2333

Boron-enhanced diffusion of boron: Physical mechanisms

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COMPUTER SIMULATION; DATA REDUCTION; INTERDIFFUSION (SOLIDS); ION IMPLANTATION; MOLECULAR BEAM EPITAXY; SEMICONDUCTOR DOPING; SEMICONDUCTOR GROWTH; SEMICONDUCTOR JUNCTIONS; SUBSTRATES; SUPERSATURATION;

EID: 0032621457     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123841     Document Type: Article
Times cited : (48)

References (20)
  • 13
    • 85034198564 scopus 로고    scopus 로고
    • note
    • -2 at 800°C, i.e., the diffusion length after a 3000 s anneal is ≈ 1 μm. If there were interstitial injection it would have reached the marker layers.
  • 17
    • 85034157148 scopus 로고    scopus 로고
    • private communication
    • L. Pelaz (private communication).
    • Pelaz, L.1
  • 18
    • 85034164521 scopus 로고    scopus 로고
    • note
    • m clusters or the silicon boride phase. Unfortunately, these effects are not well understood at present.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.