-
2
-
-
0001528106
-
-
H.-J. Gossmann, T. E. Haynes, P. A. Stolk, D. C. Jacobson, G. H. Gilmer, J. M. Poate, H. S. Luftman, T. K. Mogi, and M. O. Thompson, Appl. Phys. Lett. 71, 3862 (1997).
-
(1997)
Appl. Phys. Lett.
, vol.71
, pp. 3862
-
-
Gossmann, H.-J.1
Haynes, T.E.2
Stolk, P.A.3
Jacobson, D.C.4
Gilmer, G.H.5
Poate, J.M.6
Luftman, H.S.7
Mogi, T.K.8
Thompson, M.O.9
-
3
-
-
0004827396
-
-
P. A. Stolk, H.-J. Gossmann, D. J. Eaglesham, D. C. Jacobson, C. S. Rafferty, G. H. Gilmer, M. Jaraiz, J. M. Poate, and T. E. Haynes, J. Appl. Phys. 81, 61 (1997).
-
(1997)
J. Appl. Phys.
, vol.81
, pp. 61
-
-
Stolk, P.A.1
Gossmann, H.-J.2
Eaglesham, D.J.3
Jacobson, D.C.4
Rafferty, C.S.5
Gilmer, G.H.6
Jaraiz, M.7
Poate, J.M.8
Haynes, T.E.9
-
4
-
-
0000669252
-
-
Aditya Agarwal, H.-J. Gossmann, D. J. Eaglesham, L. Pelaz, D. C. Jacobson, T. E. Haynes, and Yu. E. Erokhin, Appl. Phys. Lett. 71, 3141 (1997).
-
(1997)
Appl. Phys. Lett.
, vol.71
, pp. 3141
-
-
Agarwal, A.1
Gossmann, H.-J.2
Eaglesham, D.J.3
Pelaz, L.4
Jacobson, D.C.5
Haynes, T.E.6
Erokhin, Yu.E.7
-
5
-
-
84886448005
-
-
Aditya Agarwal, D. J. Eaglesham, H.-J. Gossmann, L. Pelaz, S. B. Herner, D. C. Jacobson, T. E. Haynes, Y. E. Erokhin, and R. Simonton, Tech. Dig. Int. Electron Devices Meet. 467 (1997).
-
(1997)
Tech. Dig. Int. Electron Devices Meet.
, pp. 467
-
-
Agarwal, A.1
Eaglesham, D.J.2
Gossmann, H.-J.3
Pelaz, L.4
Herner, S.B.5
Jacobson, D.C.6
Haynes, T.E.7
Erokhin, Y.E.8
Simonton, R.9
-
6
-
-
0032035902
-
-
Aditya Agarwal, H.-J. Gossmann, D. J. Eaglesham, L. Pelaz, S. B. Herner, D. C. Jacobson, T. E. Haynes, and R. Simonton, Mater. Sci. Semicond. Proc. 1, 17 (1998).
-
(1998)
Mater. Sci. Semicond. Proc.
, vol.1
, pp. 17
-
-
Agarwal, A.1
Gossmann, H.-J.2
Eaglesham, D.J.3
Pelaz, L.4
Herner, S.B.5
Jacobson, D.C.6
Haynes, T.E.7
Simonton, R.8
-
7
-
-
84876791937
-
-
in press
-
Aditya Agarwal, H.-J. Gossmann, D. J. Eaglesham, S. B. Herner, A. T. Fiory, and T. E. Haynes, Appl. Phys. Lett. (in press).
-
Appl. Phys. Lett.
-
-
Agarwal, A.1
Gossmann, H.-J.2
Eaglesham, D.J.3
Herner, S.B.4
Fiory, A.T.5
Haynes, T.E.6
-
12
-
-
21544437231
-
-
H.-J. Gossmann, A. M. Vredenberg, C. S. Rafferty, H. S. Luftman, F. C. Unterwald, D. C. Jacobson, T. Boone, and J. M. Poate, J. Appl. Phys. 74, 3150 (1993).
-
(1993)
J. Appl. Phys.
, vol.74
, pp. 3150
-
-
Gossmann, H.-J.1
Vredenberg, A.M.2
Rafferty, C.S.3
Luftman, H.S.4
Unterwald, F.C.5
Jacobson, D.C.6
Boone, T.7
Poate, J.M.8
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13
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85034198564
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-
note
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-2 at 800°C, i.e., the diffusion length after a 3000 s anneal is ≈ 1 μm. If there were interstitial injection it would have reached the marker layers.
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-
-
-
16
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0002899780
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-
Leuven, Belgium, 2-4 Sept. unpublished
-
C. S. Rafferty, B. Biegel, Z. Yu, M. G. Ancona, J. Bude, and R. W. Dutton, Proc. SYSPAD'98, Leuven, Belgium, 2-4 Sept. 1998 (unpublished), p. 137.
-
(1998)
Proc. SYSPAD'98
, pp. 137
-
-
Rafferty, C.S.1
Biegel, B.2
Yu, Z.3
Ancona, M.G.4
Bude, J.5
Dutton, R.W.6
-
17
-
-
85034157148
-
-
private communication
-
L. Pelaz (private communication).
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-
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Pelaz, L.1
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18
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85034164521
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note
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m clusters or the silicon boride phase. Unfortunately, these effects are not well understood at present.
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20
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0003767280
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edited by H. R. Huff and E. Sirtl Electrochemical Society, New York
-
A. Armigliato, D. Nobili, P. Ostoja, M. Servidori, and S. Solmi, in Semiconductor Silicon, edited by H. R. Huff and E. Sirtl (Electrochemical Society, New York, 1977).
-
(1977)
Semiconductor Silicon
-
-
Armigliato, A.1
Nobili, D.2
Ostoja, P.3
Servidori, M.4
Solmi, S.5
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