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Volumn 242, Issue 1-2, 2006, Pages 146-148
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Ion irradiation through SiO2/Si interfaces: Non-conventional fabrication of Si nanocrystals for memory applications
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Author keywords
Ion irradiation; Nanocluster; Non volatile multi dot floating gate memory; Phase separation
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Indexed keywords
ION BOMBARDMENT;
IRRADIATION;
MOS DEVICES;
RAPID THERMAL ANNEALING;
SILICON COMPOUNDS;
SINGLE CRYSTALS;
ION IRRADIATION;
NANOCLUSTER;
NON-VOLATILE MULTIDOT-FLOATING GATE MEMORIES;
NANOSTRUCTURED MATERIALS;
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EID: 28544435640
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2005.08.011 Document Type: Conference Paper |
Times cited : (14)
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References (9)
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