Future of atomic resolution electron microscopy for materials science

Materials Science and Engineering R: Reports

Volumn 26, Issue 1, 1999, Pages 1-49

  Spence, J C H ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; CRYSTAL DEFECTS; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGE ANALYSIS; MATHEMATICAL MODELS; OPTICAL RESOLVING POWER; PHASE TRANSITIONS; SCANNING ELECTRON MICROSCOPY; STATISTICAL METHODS; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC RESOLUTION ELECTRON MICROSCOPY;

MATERIALS SCIENCE;

EID: 0033365821     PISSN: 0927796X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-796X(99)00005-4     Document Type: Article

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