High-resolution imaging with an aberration-corrected transmission electron microscope

Ultramicroscopy

Volumn 92, Issue 3-4, 2002, Pages 233-242

  Lentzen, M ^a   Jahnen, B ^a   Jia, C L ^a   Thust, A ^a   Tillmann, K ^a   Urban, K ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Aberration correction; Delocalisation; High resolution imaging; Spherical aberration; Transmission electron microscopy

Indexed keywords

ABERRATIONS; DISLOCATIONS (CRYSTALS); ELECTROMAGNETISM; ELECTRON DIFFRACTION; ELECTRON TRANSITIONS; GRAIN BOUNDARIES; HETEROJUNCTIONS; OPTICAL INSTRUMENT LENSES; SEMICONDUCTOR MATERIALS; TRANSMISSION ELECTRON MICROSCOPY;

SPHERICAL ABERRATION;

IMAGING TECHNIQUES;

ARTICLE; CONTRAST; CONTROLLED STUDY; ELECTRON MICROSCOPE; ERROR; HIGH RESOLUTION IMAGING; IMAGING; OPTICS; PHYSICAL PHENOMENA; SPHERIC ABERRATION; TECHNIQUE; THEORY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0036290065     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(02)00139-0     Document Type: Article

References (16)