Early results from an aberration-corrected JEOL 2200FS STEM/TEM at Oak Ridge National Laboratory

Microscopy and Microanalysis

Volumn 12, Issue 6, 2006, Pages 483-491

  Blom, Douglas A ^a   Allard, Lawrence F ^a   Mishina, Satoshi ^b   O'Keefe, Michael A ^c  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b JEOL USA INC   (United States)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Aberration corrected scanning transmission electron microscopy; Atomic resolution; High angle annular dark field imaging; Single atom imaging

Indexed keywords

EID: 33947528661     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927606060570     Document Type: Conference Paper

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