Towards sub-Angstrom electron beams

Ultramicroscopy

Volumn 78, Issue 1, 1999, Pages 1-11

  Krivanek, O L ^a   Dellby, N ^a   Lupini, A R ^a  

^a Nion Co Kirkland   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; ELECTRON BEAMS; ELECTRON OPTICS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

SCANNING TRANSMISSION ELECTRON MICROSCOPES (STEM); SUB-ANGSTROM ELECTRON BEAMS;

ELECTRON MICROSCOPES;

EID: 0032667812     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00013-3     Document Type: Article

References (17)

1. P.W. Hawkes, E. Kasper, in: Principles of Electron Optics, vol. 2, Academic Press, New York, 1996, Ch. 41.
2. O. Scherzer Zeitschrift Physik 101 1936 593
3. O. Scherzer Optik 2 1947 114
4. J.H.M. Deltrap, Ph.D. Thesis, University of Cambridge, 1964.
5. J.H.M. Deltrap, Proceedings third EUREM Congress, Prague, vol. 1, 1964, p. 45.
6. Proceedings Cornell workshop on Analytical electron microscopy, 1978.
7. Proceedings Aussois workshop on Analytical electron microscopy, 1988.
8. J. Zach M. Haider Optik 99 1995 112
9. M. Haider G. Braunshausen E. Schwan Optik 99 1995 167
10. M. Haider Nature 392 1998 768
11. O.L. Krivanek et al., in: J.M. Rodenburg (Ed.), IoP Conference Series, vol. 153, 1997, p. 35.
12. O.L. Krivanek et al., Proceedings 14th International EM Congress (Cancun) 1 (1998) 55.
13. D.C. Carey et al., CERN Report 73-16, CERN, Geneva, 1993.
14. J.A. Lin J.M. Cowley Ultramicroscopy 19 1986 31
15. O.L. Krivanek G.Y. Fan Scanning Microscopy 6 Suppl. 1994 105
16. H. Rose Ultramicroscopy 78 1999 13
17. P.D. Nellist S.J. Pennycook Phys. Rev. Lett. 81 1998 4156