Fine crystal lattice fringes observed using a transmission electron microscope with 1 MeV coherent electron waves

Applied Physics Letters

Volumn 76, Issue 10, 2000, Pages 1342-1344

  Kawasaki, T ^a,b   Yoshida, T ^a,b   Matsuda, T ^a,b   Osakabe, N ^a,b   Tonomura, A ^a,b   Matsui, I ^a   Kitazawa, K ^b,c  

^a HITACHI LTD   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000315066     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126028     Document Type: Article

References (17)

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