Preliminary results from the first monochromated and aberration corrected 200-kV field-emission scanning transmission electron microscope

Microscopy and Microanalysis

Volumn 12, Issue 6, 2006, Pages 498-505

  Walther, Thomas ^a   Stegmann, Heiko ^b  

^a CENTER OF ADVANCED EUROPEAN STUDIES AND RESEARCH CAESAR   (Germany)

^b CARL ZEISS SMT AG   (Germany)

Author keywords

Annular dark field (ADF) imaging; Chromatic focus spread; Cs corrector; Electron energy loss spectroscopy (EELS); Monochromator; Scanning transmission electron microscopy (STEM); Spherical aberration

Indexed keywords

EID: 33947541510     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927606060697     Document Type: Conference Paper

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