Hybrid CMOS/nanoelectronic digital circuits: Devices, architectures, and design automation

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

Volumn 2005, Issue , 2005, Pages 375-382

  DeHon, André ^a   Likharev, Konstantin K ^b  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b STONY BROOK UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS SUBSYSTEM; DEFECT TOLERANCE; DESIGN AUTOMATION; NANOELECTRONIC DIGITAL CIRCUITS;

CRYSTAL DEFECTS; DIGITAL CIRCUITS; PRODUCT DESIGN;

CMOS INTEGRATED CIRCUITS;

EID: 33745845381     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2005.1560097     Document Type: Conference Paper

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