NanoCell Electronic Memories

Journal of the American Chemical Society

Volumn 125, Issue 43, 2003, Pages 13279-13283

  Tour, James M ^a   Cheng, Long ^a   Nackashi, David P ^b   Yao, Yuxing ^a   Flatt, Austen K ^a   St Angelo, Sarah K ^c   Mallouk, Thomas E ^c   Franzon, Paul D ^b  

^a RICE UNIVERSITY   (United States)

^b North Carolina State University   (United States)

^c PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARRAYS; ELECTRIC CONDUCTIVITY; LOGIC DEVICES; SWITCHING;

NANOSCALE ARRAYS;

DATA STORAGE EQUIPMENT;

NANOPARTICLE;

ARTICLE; CONDUCTANCE; DEVICE; ELECTRONICS; LOGIC; MEMORY; METAL BINDING; MOLECULAR DYNAMICS; NANOCELL; OZONE LAYER; PRODUCT RECOVERY; REPRODUCIBILITY; ROOM TEMPERATURE; SIMULATION; SWITCH TYPE MEMORY; TASK PERFORMANCE;

EID: 0142151775     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja036369g     Document Type: Article

References (30)

1. Tour, J. M. Molecular Electronics: Commercial Insights, Chemistry, Devices, Architecture and Programming; World Scientific: Teaneck, NJ, 2003.
2. Tour, J. M. Acc. Chem. Res. 2000, 33, 791.
3. (a) Carroll, R. L.; Gorman, C. B. Angew. Chem., Int. Ed. 2002, 41, 4378-4400.
4. (b) Goldhaber-Gordon, D.; Montemerlo, M. S.; Love, J. C.; Opiteck, G. J. ; Ellenbogen, J. C. Proc. IEEE 1997, 85 (4), 521-540.
5. Heath, J. R.; Kuekes, P. J.; Snider, G. S.; Williams, R. S. Science 1998, 280, 1716.
6. Lent, C. S.; Tougaw, P. D. Proc. IEEE 1997, 85, 541-557.
7. Goldstein, S. C.; Budiu, M. Proc. ISCA 2001, 178-191.
8. Melosh, N. A.; Boukai, A.; Diana, F.; Geradot, B.; Badoloato, A.; Petrof, P. M.; Heath, J. R. Science 2003, 300, 112-115.
9. Huang, Y.; Duan, X.; Cui, Y.; Lauhon, L. J.; Kim, K.-H.; Lieber, C. M. Science 2001, 294, 1313.
10. Tour, J. M.; Van Zandt, W. L.; Husband, C. P.; Husband, S. M.; Wilson, L. S.; Franzon, P. D.; Nackashi, D. P. IEEE Trans. Nanotechnol. 2002, 1, 100.
11. Chen, J.; Reed, M. A.; Rawlett, A. M.; Tour, J. M. Science 1999, 286, 1550.
12. Compound 1 was prepared by the formation of the α-thiolacetate γ-thioltert-butoxycarbonyl. The latter was removed with TFA without disruption of the thiolacetate. A manuscript (Flatt, A. K.; Yao, Y.; Maya, F.; Tour, J. M.) is in preparation detailing this orthogonal deprotection approach.
13. Chen, J.; Wang, W.; Reed, M. A.; Rawlett, A. M.; Price, D. W.; Tour, J. M. Appl. Phys. Lett. 2000, 77, 1224.
14. Mbindyo, J. K. N.; Mallouk, T. E.; Mattzela, J. B.; Kratochvilova, I.; Razavi, B.; Jackson, T. N.; Mayer, T. S. J. Am. Chem. Soc. 2002, 124, 4020.
15. Assemblies of thiols on Au nanorods have been studied. See, for example, (a) Martin, B. R.; Dermody, D. J.; Reiss, B. D.; Fang, M.; Lyon, L. A.; Natan, M. J.; Mallouk, T. E. Adv. Mater. 1999, 11, 1021-1025.
16. (b) Martin, B. R.; St. Angelo, S. K.; Mallouk, T. E. Adv. Funct. Mater. 2002, 12, 759.
17. Tour, J. M.; Jones, L., II; Pearson, D. L.; Lamba, J. S.; Burgin, T. P.; Whitesides, G. W.; Allara, D. L.; Parikh, A. N.; Atre, S. J. Am. Chem. Soc. 1995, 117, 9529.
18. This was further verified by the assembly of 1 on a surface of freshly deposited Au (on Cr/Si) for 24 h, in the absence and presence of polycarbonate, and checking by ellipsometry after rinsing the surface well. Ellipsometric thicknesses were consistent with near-monolayer formation of 1: 2.8 ± 0.25 nm in the absence of polycarbonate (calcd 2.5 nm excluding the tilt15 from the surface normal) and 3.1 ± 0.25 nm in the presence of polycarbonate. Therefore, as expected,14 polycarbonate did not affect the SAM formation; however, a small amount of multilayer formation was occurring, presumably due to loss of the acetate and disulfide formation over the prolonged assembly time.15
19. Cai, L.; Yao, Y.; Yang, J.; Price, D. W., Jr.; Tour, J. M. Chem. Mater. 2002, 14, 2905.
20. Compound 2 has been prepared previously. See Bain, C. D.; Troughton, E. B.; Tao, Y.-T.; Evall, J.; Whitesides, G. M.; Nuzzo, R. G. J. Am. Chem. Soc. 1989, 111, 321. Note that 2 is ∼1 Å shorter in length than 1; however, the effective length of 2 will be ∼3-4 Å shorter since alkanethiols have ∼33° tilt from the surface normal (resulting in 1.8 nm Au-to-acetate distance) while the OPEs have <20° tilt.15
21. Seminario, J. M.; Derosa, P. A.; Bastos, J. L. J. Am. Chem. Soc. 2002, 124, 10266-10267.
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23. Fan, F.-R. F.; Yang, J.; Cai, L.; Price, D. W.; Dirk, S. M.; Kosynkin, D.; Yao, Y.; Rawlett, A. M.; Tour, J. M.; Bard, A. J. J. Am. Chem. Soc. 2002, 124, 5550.
24. Donhauser, Z. J.; Mantooth, B. A.; Kelly, K. F.; Bumm, L. A.; Monnell, J. D.; Stapleton, J. J.; Price, D. W., Jr.; Rawlett, A. M.; Allara, D. L.; Tour, J. M.; Weiss, P. S. Science 2001, 292, 2303.
25. Rawlett, A. M.; Hopson, T. J.; Nagahara, L. A.; Tsui, R. K.; Ramachandran, G. K.; Lindsay, S. M. Appl. Phys. Lett. 2002, 81, 3043.
26. Buckley, W. D. U.S. Patent 3,980,505, September 14, 1976.
27. Chesnys, S.-A.; Karpinskas, A. U. Technol. Phys. 2002, 47, 58.
28. Simmons, J. G.; Verderber, R. R. Proc. R. Soc. London, Ser. A, Math Phys. Sci. 1967, 301, 77.
29. Thurstans, R. E.; Oxley, D. P. J. Phys. D: Appl. Phys. 2002, 35, 802.
30. There may have been adventitious airborne molecules assembled between the metallic islands; however, we always treated the chips with UV ozone prior to use. Therefore, their presence is unlikely to be a significant factor.