Report on the 42nd IUVSTA workshop 'electron scattering in solids: From fundamental concepts to practical applications'

Surface and Interface Analysis

Volumn 38, Issue 2, 2006, Pages 88-117

  Kover L ^a   Powell, C J ^b  

^a INSTITUTE OF EXPERIMENTAL MEDICINE   (Hungary)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Auger electron spectroscopy; Core hole effects; Elastic electron scattering; Elastic peak electron spectrososcopy; Electron transport; Electron probe microanalysis; Inelastic electron scattering; Inelastic mean free path

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTRON TRANSPORT PROPERTIES; SOLIDS; X RAY PHOTOELECTRON SPECTROSCOPY;

CORE-HOLE EFFECTS; ELASTIC ELECTRON SCATTERING; ELECTRON-PROBE MICROANALYSIS; INELASTIC ELECTRON SCATTERING; INELASTIC MEAN FLOW PATH;

ELECTRON SCATTERING;

EID: 31644432700     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2137     Document Type: Conference Paper

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