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Journal of Electron Spectroscopy and Related Phenomena

Volumn 135, Issue 2-3, 2004, Pages 177-182

Contribution of intrinsic and extrinsic excitations to KLL Auger spectra induced from Ge films

(7) Berenyi Z a Kover L a Tougaard, S b Yubero, F c Toth J a Cserny, I a Varga, D a

a INSTITUTE OF EXPERIMENTAL MEDICINE (Hungary)

b UNIVERSITY OF SOUTHERN DENMARK (Denmark)

c INSTITUTO DE CIENCIA DE MATERIALES DE SEVILLA (Spain)

Author keywords

Auger spectroscopy; Inelastic mean free path; Inelastic scattering; X ray photoelectron spectroscopy

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTRON SCATTERING; ELECTRON TRANSITIONS; ELECTRONIC STRUCTURE; POLYCRYSTALLINE MATERIALS; RADIATION; SEMICONDUCTING FILMS; X RAY PHOTOELECTRON SPECTROSCOPY; X RAYS;

AUGER SPECTROSCOPY; INELASTIC MEAN FREE PATH; INELASTIC SCATTERING;

SEMICONDUCTING GERMANIUM;

EID: 2942568006 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/j.elspec.2004.03.005 Document Type: Article

Times cited : (14)

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