Surface effects on angular distributions in X-ray-photoelectron spectroscopy

Surface Science

Volumn 519, Issue 1-2, 2002, Pages 115-124

  Chen, Y F ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

Dielectric phenomena; Electron emission; X ray photoelectron spectroscopy

Indexed keywords

DAMPING; DIELECTRIC PROPERTIES OF SOLIDS; ELECTRON EMISSION; ELECTRON SCATTERING; ELECTRONS; X RAY PHOTOELECTRON SPECTROSCOPY;

SURFACE EFFECTS;

SURFACE PROPERTIES;

EID: 0036838366     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(02)02206-9     Document Type: Article

References (48)

1. Woodruff D.P., Delchar T.A. Modern Techniques of Surface Science. 1986;Cambridge University Press, New York.
2. Riviere J.C. Surface Analytical Techniques. 1990;Clarendon, Oxford.
3. Tougaard S. Surf. Interface Anal. 8:1986;257.
4. Fulghum J.E. Surf. Interface Anal. 20:1993;161.
5. Jablonski A., Powell C.J. Phys. Rev. B. 50:1994;4739.
6. Gries W.H. J. Vac. Sci. Technol. A. 13:1995;1304.
7. Baschenko O.A., Nefedov V.I. J. Electron. Spectrosc. Relat. Phenom. 17:1979;405.
8. Ebel H., Ebel M.F., Jablonski A. J. Electron. Spectrosc. Relat. Phenom. 35:1985;155.
9. Jablonski A. Surf. Interface Anal. 14:1989;659.
10. Werner W.S.M. Surf. Interface Anal. 18:1992;217.
11. Yoshikawa H., Tsukamoto T., Shimizu R., Crist V. Surf. Interface Anal. 18:1992;757.
12. Jablonski A. Surf. Interface Anal. 23:1995;29.
13. Tofterup A.L. Phys. Rev. B. 32:1985;2808.
14. Dwyer V.M., Matthew J.A.D. Surf. Sci. 193:1988;549.
15. Bindi R., Lanteri H., Rostaing P. Surf. Sci. 197:1988;295.
16. Tilinin I.S., Werner W.S.M. Phys. Rev. B. 46:1992;13739.
17. Werner W.S.M., Tilinin I.S., Hayek M. Phys. Rev. B. 50:1994;4819.
18. Jablonski A., Tilinin I.S. J. Electron. Spectrosc. Relat. Phenom. 74:1995;207.
19. Jablonski A., Powell C.J. Surf. Interface Anal. 20:1993;771.
20. Chen Y.F., Chen Y.T. Phys. Rev. B. 53:1996;4980.
21. Chen Y.F., Su P., Kwei C.M., Tung C.J. Phys. Rev. B. 50:1994;17547.
22. Chen Y.F. J. Vac. Sci. Technol.A. 13:1995;2665.
23. Chen Y.F. Surf. Sci. 345:1996;213.
24. Tougaard S. Phys. Rev. B. 34:1986;6779.
25. Hawn D.D., De Koven B.M. Surf. Interface Anal. 10:1987;63.
26. Tougaard S., Kraaer J. Phys. Rev. B. 43:1991;1651.
27. Yubero F., Tougaard S. Phys. Rev. B. 46:1992;2486.
28. Yoshikawa H., Shimizu R., Ding Z.J. Surf. Sci. 261:1992;403.
29. Yubero F., Tougaard S. Surf. Interface Anal. 19:1992;269.
30. Cohen Simonsen A., Yubero F., Tougaard S. Phys. Rev. 56:1997;1612.
31. Ritchie R.H. Phys. Rev. 106:1957;874.
32. Fedders P.A. Phys. Rev. 153:1967;438.
33. Beck D.E. Phys. Rev. B. 4:1971;1555.
34. Dobson J.F., Harris G.H. J. Phys. C. 20:1987;6127.
35. Ritchie R.H., Marusak A.L. Surf. Sci. 4:1966;234.
36. Nazarov V. Phys. Rev. B. 49:1994;10663.
37. Smith D.Y., Shiles E. Phys. Rev. B. 17:1978;4689.
38. Palik E.D. Handbook of Optical Constants of Solids. 1985;Academic Press, New York.
39. Feibelman P.J. Prog. Surf. Sci. 12:1982;287.
40. Feibelman P.J. Phys. Rev. B. 9:1974;5077.
41. Ritchie R.H., Hamm R.N., Turner J.E., Wright H.A., Bolch W.E. Glass W.A., Varma M.N. Physical and Chemical Mechanisms in Molecular Radiation Biology. 1991;99 Plenum Press, New York.
42. Egerton R.F. Electron Energy-Loss Spectroscopy in the Electron Microscope. 1986;Plenum Press, New York.
43. Powell C.J. Phys. Rev. 175:1968;511.
44. Fadley C.S., Baird R.J., Siekhaus W., Novakov T., Bergstrom A.A.L. J. Electron. Spectrosc. Relat. Phenom. 4:1974;93.
45. Reilman R.F., Msezane A., Manson S.T. J. Electron. Spectrosc. Relat. Phenom. 8:1976;389.
46. Jablonski A., Zemek J. Phys. Rev. B. 48:1993;4799.
47. Hucek S., Tilinin I.S., Zemek J. J. Electron. Spectrosc. Relat. Phenom. 85:1997;263.
48. Baschenko O.A., Machavariani G.V., Nefedov V.I. J. Electron. Spectrosc. Relat. Phenom. 34:1984;305.