Quantitative x-ray photoelectron spectroscopy: Simple algorithm to determine the amount of atoms in the outermost few nanometers

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 21, Issue 4, 2003, Pages 1081-1086

  Tougaard, Sven ^a  

^a UNIVERSITY OF SOUTHERN DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ATOMS; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; GOLD; NICKEL; NUMERICAL ANALYSIS; PHOTONS;

INELASTIC ELECTRON SCATTERING; SURFACE ANALYSIS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0042030908     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1564040     Document Type: Article

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