Emission-depth-selective Auger photoelectron coincidence spectroscopy

Physical Review Letters

Volumn 94, Issue 3, 2005, Pages

  Werner, Wolfgang S M ^a   Smekal, Werner ^a   Störi, Herbert ^a   Winter, Hannspeter ^a   Stefani, Giovanni ^b   Ruocco, Alessandro ^b   Offi, Francesco ^b   Gotter, Roberto ^c   Morgante, Alberto ^c,d   Tommasini, Fernando ^c,d  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b ROMA TRE UNIVERSITY   (Italy)

^c LABORATORIO TASC   (Italy)

^d UNIVERSITY OF TRIESTE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ANGULAR DISTRIBUTION; AUGUR PHOTOELECTRON COINCIDENCE SPECTROSCOPY; NANOSCALE LEVELS; QUANTITIVE MODELS;

ACTIVATION ANALYSIS; ADHESIVES; MAGNETISM; MATHEMATICAL MODELS; OPTICAL MICROSCOPY; POLYMERS; SUPERPARAMAGNETISM; VAN DER WAALS FORCES;

PHOTOELECTRON SPECTROSCOPY;

EID: 18044362495     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.94.038302     Document Type: Article

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