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Volumn 495, Issue 1-2, 2001, Pages 107-119

The three-step model in electron spectroscopy revisited I. Angular distribution of Auger electron emission from non-crystalline Al, Si and Cu surfaces

(4) Werner, Wolfgang S M a Tratnik, Herbert a Brenner, Josef a Störi, Herbert a

a VIENNA UNIVERSITY OF TECHNOLOGY (Austria)

Author keywords

Aluminum; Copper; Electron emission; Electron energy loss spectroscopy (EELS); Electron solid interactions; Electron solid scattering and transmission elastic; Electron solid scattering and transmission inelastic; Silicon; Surface structure, morphology, roughness, and topography

Indexed keywords

ALUMINUM; ANGLE MEASUREMENT; AUGER ELECTRON SPECTROSCOPY; COPPER; ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; ENERGY DISSIPATION; LOW ENERGY ELECTRON DIFFRACTION; SILICON;

ELECTRON REFRACTION;

SURFACE ROUGHNESS;

EID: 0035842172 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(01)01516-3 Document Type: Article

Times cited : (8)

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