Report on the 34th IUVSTA Workshop 'XPS: From Spectra to Results - Towards an Expert System'

Surface and Interface Analysis

Volumn 36, Issue 3, 2004, Pages 225-237

  Castle, J E ^a   Powell, C J ^b  

^a UNIVERSITY OF SURREY   (United Kingdom)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Electron spectroscopy; Expert system; IUVSTA workshop; Quantitative analysis; XPS

Indexed keywords

ALGORITHMS; COMPOSITION; DATA ACQUISITION; EXPERT SYSTEMS; INFORMATION RETRIEVAL; INTERNET; LEARNING SYSTEMS; MORPHOLOGY; PERSONAL COMPUTERS; PROBLEM SOLVING; TECHNICAL PRESENTATIONS; X RAY PHOTOELECTRON SPECTROSCOPY;

IUVSTA WORKSHOP; NARROW SCANS;

SURFACE CHEMISTRY;

EID: 1842815720     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1678     Document Type: Conference Paper

References (6)

1. Castle JE, Baker MA. Sixth International Conference on Quantitative Surface Analysis, National Physical Laboratory, UK, 1990; Castle JE, Baker MA. J. Electron Spectrosc. Relat. Phenom. 1999; 105: 245.
2. Castle JE, Baker MA. Sixth International Conference on Quantitative Surface Analysis, National Physical Laboratory, UK, 1990; Castle JE, Baker MA. J. Electron Spectrosc. Relat. Phenom. 1999; 105: 245.
3. Barthes-Labrousse MG. Surf. Interface Anal. 1998; 26: 72.
4. Kover L. Surf. Interface Anal. 2000; 29: 671.
5. Castle JE. Surf. Interface Anal. 2002; 33: 196.
6. http://www.iuvsta.org/W34.html.