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Volumn 68, Issue 15, 2003, Pages

Electron backscattering from surfaces: The invariant-embedding approach

Author keywords

[No Author keywords available]

Indexed keywords

AB INITIO CALCULATION; ACCURACY; ANALYTIC METHOD; ARTICLE; ELECTRON; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY; INTERMETHOD COMPARISON; MATHEMATICAL ANALYSIS; MOLECULAR PHYSICS; MONTE CARLO METHOD; SIMULATION; THEORETICAL MODEL;

EID: 0942279915     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.68.155409     Document Type: Article
Times cited : (22)

References (25)
  • 23
    • 0342625685 scopus 로고    scopus 로고
    • U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology Standard Reference Data Program, Gaithersburg, MD
    • A. Jablonski and S. Tougaard, NIST Elastic-Electron-Scattering Cross-Section Database version 1.0 user’s guide (U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology Standard Reference Data Program, Gaithersburg, MD, 1996).
    • (1996) NIST Elastic-Electron-Scattering Cross-Section Database Version 1.0 user’s Guide
    • Jablonski, A.1    Tougaard, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.