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Volumn 31, Issue 3, 2001, Pages 141-176
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Electron transport in solids for quantitative surface analysis
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Author keywords
Auger electron; Auger electron spectroscopy (AES); Elastic; Elastic peak electron spectroscopy (EPES); Electron; Electron probe microanalysis (EPMA); Inelastic; Microscopy; Photoelectron; Reflection electron energy loss spectroscopy (REELS); Scattering; Spectroscopy; Surface analysis; Total electron yield (TEY); Transport; X ray photoelectron spectroscopy (XPS)
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Indexed keywords
APPROXIMATION THEORY;
AUGER ELECTRON SPECTROSCOPY;
COMPOSITION;
ELASTICITY;
ELECTRON BEAMS;
ELECTRON SCATTERING;
ELECTRON TRANSPORT PROPERTIES;
ELECTRONS;
ION BOMBARDMENT;
MONTE CARLO METHODS;
SOLIDS;
X RAY PHOTOELECTRON SPECTROSCOPY;
ELASTIC PEAK ELECTRON SPECTROSCOPY;
ELECTRON BOMBARDMENT;
ELECTRON PROBE MICROANALYSIS;
ELECTRON SOLID INTERACTION;
INELASTIC ELECTRON BACKSCATTERING;
QUASI ELASTIC ELECTRON REFLECTION;
RELATIVISTIC ENERGY;
SURFACE ANALYSIS;
SURFACE SENSITIVITY;
TOTAL ELECTRON YIELD;
SURFACE CHEMISTRY;
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EID: 0035274058
PISSN: 01422421
EISSN: None
Source Type: Journal
DOI: 10.1002/sia.973 Document Type: Article |
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Times cited : (318)
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References (201)
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