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Surface and Interface Analysis

Volumn 36, Issue 8, 2004, Pages 788-792

Surface roughness and island formation effects in ARXPS quantification

(4) Martin Concepcion A I a Yubero, F a Espinos J P a Tougaard, S b

a INSTITUTO DE CIENCIA DE MATERIALES DE SEVILLA (Spain)

b UNIVERSITY OF SOUTHERN DENMARK (Denmark)

Author keywords

ARXPS; Island growth; Quantitative XPS; Surface roughness; ZnO

Indexed keywords

ANGLE-RESOLVED XPS(ARXPS); ISLAND GROWTH; PEAK INTENSITY;

ANGLE MEASUREMENT; GROWTH (MATERIALS); MORPHOLOGY; NANOSTRUCTURED MATERIALS; SUBSTRATES; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

SURFACE ROUGHNESS;

EID: 4444264656 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.1765 Document Type: Conference Paper

Times cited : (38)

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