|
Volumn 592, Issue 1-3, 2005, Pages 1-7
|
Test of dielectric-response model for energy and angular dependence of plasmon excitations in core-level photoemission
|
Author keywords
Dielectric phenomena; Electron solid scattering and transmission inelastic; Photoelectron spectroscopy; Silicon
|
Indexed keywords
DIELECTRIC PROPERTIES;
ENERGY DISSIPATION;
KINETIC ENERGY;
PHOTOELECTRON SPECTROSCOPY;
MEAN FREE PATHS;
PHOTOELECTRON PEAKS;
PHOTOEMISSION LINES;
PHOTOEMISSION;
|
EID: 25644435636
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/j.susc.2005.06.028 Document Type: Article |
Times cited : (20)
|
References (35)
|