Use of QUASES™/XPS measurements to determine the oxide composition and thickness on an iron substrate

Surface and Interface Analysis

Volumn 36, Issue 7, 2004, Pages 632-639

  Grosvenor, A P ^a   Kobe, B A ^a   McIntyre, N S ^a   Tougaard, S ^b   Lennard, W N ^a  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

^b UNIVERSITY OF SOUTHERN DENMARK   (Denmark)

Author keywords

Fe oxidation; NRA; QUASES ; XPS

Indexed keywords

FILM GROWTH; IRON; KINETIC ENERGY; MAGNETITE; OXIDATION; OXIDES; POLYCRYSTALLINE MATERIALS; X RAY PHOTOELECTRON SPECTROSCOPY;

FE OXIDATION; NRA; QUASES™;

SURFACE CHEMISTRY;

EID: 3242725008     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1842     Document Type: Article

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