SCOPUS 정보 검색 플랫폼

Journal of Physical and Chemical Reference Data

Volumn 28, Issue 1, 1999, Pages 19-62

Evaluation of calculated and measured electron inelastic mean free paths near solid surfaces

a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

Author keywords

Auger electron spectroscopy; Elastic peak electron spectroscopy; Electron inelastic mean free path; Inelastic electron scattering; Inelastic mean free path; Solid surfaces; Surface analysis; Surface characterization; X ray photoelectron spectroscopy

Indexed keywords

ALUMINA; ALUMINUM OXIDE; AUGERS; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ELECTRON TRANSITIONS; LUNAR SURFACE ANALYSIS; ONTOLOGY; PHOTOELECTRONS; PHOTONS; POTASSIUM COMPOUNDS; SILICA; SPECTRUM ANALYSIS; SURFACE ANALYSIS; UNCERTAINTY ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

ELASTIC PEAK ELECTRON SPECTROSCOPY; ELECTRON INELASTIC MEAN FREE PATHS; INELASTIC ELECTRON SCATTERING; INELASTIC MEAN FREE PATH; SOLID SURFACE; SURFACE CHARACTERIZATION;

AUGER ELECTRON SPECTROSCOPY;

EID: 0033240593 PISSN: 00472689 EISSN: None Source Type: Journal
DOI: 10.1063/1.556035 Document Type: Review

Times cited : (472)

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