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Volumn 35, Issue 3, 2003, Pages 268-275

Calculation of electron inelastic mean free paths (IMFPs) VII. Reliability of the TPP-2M IMFP predictive equation

Author keywords

AES; Inelastic mean free path; TPP 2M equation; XPS

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTRONS; POTASSIUM COMPOUNDS; RELIABILITY; X RAY PHOTOELECTRON SPECTROSCOPY; YTTRIUM COMPOUNDS;

EID: 0037339998     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1526     Document Type: Article
Times cited : (400)

References (25)
  • 14
    • 0003902695 scopus 로고    scopus 로고
    • SRD 71, Version 1.1. US Department of Commerce, National Institute of Standards and Technology: Gaithersburg, MD
    • Powell CJ, Jablonski A. NIST Electron Inelastic-Mean-Free-Path Database, SRD 71, Version 1.1. US Department of Commerce, National Institute of Standards and Technology: Gaithersburg, MD, 2000.
    • (2000) NIST Electron Inelastic-Mean-Free-Path Database
    • Powell, C.J.1    Jablonski, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.