Spatial distribution of electron-hole pairs induced by electrons and protons in SiO2

IEEE Transactions on Nuclear Science

Volumn 51, Issue 6 II, 2004, Pages 3211-3218

  Murat, M ^a   Akkerman, A ^a   Barak, J ^a  

^a SOREQ NUCLEAR RESEARCH CENTER   (Israel)

Author keywords

Charge yield; Monte Carlo (MC) simulation; Recombination; Track structure calculations

Indexed keywords

COMPUTER SIMULATION; ELECTRIC FIELDS; ELECTRON IRRADIATION; ELECTRON TRANSITIONS; ELECTRONIC STRUCTURE; ELECTRONS; MONTE CARLO METHODS; PROTONS;

CHARGE-YIELD; RECOMBINATION; SPATIAL DISTRIBUTION; TRACK-STRUCTURE CALCULATIONS;

SILICA;

EID: 11044222051     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2004.839148     Document Type: Conference Paper

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