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Volumn 26, Issue 4, 1998, Pages 249-269
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Accuracy of the non-destructive surface nanostructure quantification technique based on analysis of the XPS or AES peak shape
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Author keywords
[No Author keywords available]
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
ELECTRON SCATTERING;
NANOSTRUCTURED MATERIALS;
NONDESTRUCTIVE EXAMINATION;
SPECTRUM ANALYSIS;
X RAY PHOTOELECTRON SPECTROSCOPY;
QUANTITATIVE SURFACE ANALYSIS;
SURFACE STRUCTURE;
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EID: 0032047486
PISSN: 01422421
EISSN: None
Source Type: Journal
DOI: 10.1002/(SICI)1096-9918(199804)26:4<249::AID-SIA368>3.0.CO;2-A Document Type: Article |
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Times cited : (273)
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References (72)
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