SCOPUS 정보 검색 플랫폼

Journal of Electron Spectroscopy and Related Phenomena

Volumn 124, Issue 1, 2002, Pages 25-37

Monte Carlo simulation of secondary electron emission from the insulator SiO2

(2) Schreiber, E a Fitting, H J a

a UNIVERSITY OF ROSTOCK (Germany)

Author keywords

Electron attenuation; Electron cascading; Electron phonon scattering; Impact ionization; Secondary electron emission

Indexed keywords

AMORPHOUS MATERIALS; BAND STRUCTURE; COMPUTER SIMULATION; DIELECTRIC MATERIALS; ELECTRON SCATTERING; IMPACT IONIZATION; MONTE CARLO METHODS; PHONONS; SILICA;

ELECTRON CASCADING; INTERBAND SCATTERING;

ELECTRON EMISSION;

EID: 0036604307 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/S0368-2048(01)00368-1 Document Type: Article

Times cited : (120)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.