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Volumn 440, Issue 1-2, 1999, Pages 1-40
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Electron transport processes in reflection electron energy loss spectroscopy (REELS) and X-ray photoelectron spectroscopy (XPS)
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM;
ELASTICITY;
ELECTRIC EXCITATION;
ELECTRON ENERGY LOSS SPECTROSCOPY;
ELECTRON SCATTERING;
MONTE CARLO METHODS;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
X RAY PHOTOELECTRON SPECTROSCOPY;
DIELECTRIC THEORY;
MARKHOVIAN TRANSPORT PROCESS;
REFLECTION ELECTRON ENERGY LOSS SPECTROSCOPY;
ELECTRON TRANSPORT PROPERTIES;
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EID: 0033207318
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(99)00784-0 Document Type: Review |
Times cited : (78)
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References (76)
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