Nine-coded compression technique with application to reduced pin-count testing and flexible on-chip decompression

Proceedings - Design, Automation and Test in Europe Conference and Exhibition

Volumn 2, Issue , 2004, Pages 1284-1289

  Tehranipour, Mohammad ^a   Nourani, Mehrdad ^a   Chakrabarty, krishnendu ^b  

^a UNIVERSITY OF TEXAS AT DALLAS   (United States)

^b Duke University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSION LOGICS; NINE-CODED COMPRESSION; ON-CHIP DECOMPRESSION; PIN-COUNT TESTING; CODE-WORDS; COMPRESSION CODES; COMPRESSION TECHNIQUES; TEST APPLICATION TIME; TEST DATA; TEST DATA COMPRESSION; TEST SETS; TEST-DATA VOLUME;

AUTOMATIC TESTING; BANDWIDTH; BENCHMARKING; COMPUTER SIMULATION; RANDOM PROCESSES; SYNCHRONIZATION; DESIGN; EXHIBITIONS; INTEGRATED CIRCUIT TESTING;

DATA COMPRESSION;

EID: 3042613499     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2004.1269072     Document Type: Conference Paper

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